Hitachi Releases New Scanning Electron Microscope

On April 15, 2016, Hitachi High-tech Corporation released a new scanning electron microscope, the FlexSEM 1000, worldwide. The product has a compact structure and a small footprint, but it does not transmit large-scale electron microscopes at the same time. It is extremely easy to operate and can be operated without training.

Scanning electron microscopes can perform high-magnification observation and high-precision elemental analysis on the surface of materials, and have a wide range of applications in fields such as nanotechnology, life sciences, product design R&D, and failure analysis. In recent years, the need for scanning electron microscopy (SEM) to observe the surface fine structure and elemental analysis has been increasing. More and more users hope to use scanning electron microscopes in the limited space such as production lines, quality assurance inspection lines and office areas. Therefore, the scanning electron microscope with small size, easy operation, and high resolution attracts attention. The FlexSEM 1000 is 450mm wide and 640mm long, 52% smaller than the SU1510 model, 45% lighter, and 50% less power consumption. It is equipped with a standardized power connector. The main unit and the power supply unit can be separated and the installation is very flexible.

The FlexSEM 1000 uses the newly designed electro-optical system and a high-reliability, high-sensitivity detector with a resolution of up to 4nm. The FlexSEM 1000 has a variety of automation features that make it easy to operate, allowing even the first time operators to quickly shoot high quality images. In addition, the newly developed navigation function "SEM MAP" can use various optical pictures or electron microscope photographs to navigate, quickly and precisely switch to the high-magnification view of interest with a single key.